FACULTY
Hong, Hao-Chiao
Professor
Group: Group A (Integrated Circuit and Sensing Elements)
Office: 電機甲
Laboratory: EE807
Telephone: 03-5712121#54375
E-Mail: hchong[at]nycu.edu.tw
Learning Experience
Hao-Chiao Hong received the B.S., M.S., and Ph.D. degrees in Electrical Engineering from National Tsing-Hua University, Taiwan, in 1990, 1992, and 2003, respectively. From 1997 to 2001, he was with Taiwan Semiconductor Manufacturing Company (TSMC) where he developed mixed-signal IPs for customers and process vehicles. He joined Intellectual Property Library Company, HsinChu, Taiwan, as the senior manager of the Analog IP Department in Aug. 2001. He has been with National Chiao Tung University (NCTU), Hsinchu, Taiwan since Feb., 2004 where he is currently a professor of the Electrical and Computer Engineering department.

His main research interests include the training methods and software modeling of artificial neural networks, analog computing in memory circuit design, the design-for-testability (DFT), built-in self-test (BIST), and calibration techniques for mixed-signal systems, and high performance mixed-signal circuit design. He received the Best Paper Awards from the 2009 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) and 2016 VLSI Test Technology Workshop.

Dr. Hong served as the executive secretary of the Mixed-signal and RF Consortium of Ministry of Education, Taiwan from 2006 to 2008, and the executive secretary of the Heterogeneous Integration Consortium of Ministry of Education, Taiwan, from 2008 to 2009. He also served as the general chair of the sixth VLSI Test Technology Workshop (VTTW) in 2012, and the program chair of the fifth VTTW in 2011. He is a life member of Taiwan IC Design (TICD) Association and a life member of VLSI Test Technology Forum (VTTF), Taiwan.
Research Expertise
Mixed-signal circuit design including ADC, DAC, audio codec, PLL, filters, wireless power, power management, high speed serial interface, and sensor interfaces; design-for-testability (DfT), built-in self-test (BIST) and calibration techniques for mixed-signal circuits; Mixed-signal computing-in-memory circuit design; modeling and circuit design of Spiking neural network (SNN).
Research Results
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